北京荣兴光恒科技有限公司

尼康显微镜

北京尼康显微镜物镜

北京尼康显微镜物镜

  • 类别:尼康显微镜
  • 价格:666.66
  • 点击率:706

北京尼康显微镜物镜

北京尼康显微镜物镜



Michelson (2.5X and 5X) and Mirau (10X, 20X and 50X) Objectives Available
Infinity Corrected 200mm Tube Lens Design
Interferometry bives are used in non-contact optical profile measurement devices to obtain surface maps and surface measurement beters. They can be used to examine surface topography with very high precision—to within a frb of the wavelength of light. In these bives, a light beam passes through a beamsplitter, which directs the light to both the surface of the sample and a built-in reference mirror. The light reflected from these surfaces recombines and a fringe interference pattern is bed. The Michelson bives provide comparatively longer working distances, wider fields of view and larger depth of focus, whereas the Mirau bives are used in applications requiring higher magnification and/or numerical apertures. Use of the Nikon 200mm tube lens (#58- 520) allows these bives to be integrated to a C-Mount camera.
Magnification	2.5X	5X	10X	20X	50X	100x
Numerical Aperture	0.075	0.13	0.30	0.40	0.55	0.7
Working Distance	10.3mm	9.3mm	7.4mm	4.7mm	3.4mm	2mm
Focal Length	80.0mm	40.0mm	20.0mm	10.0mm	4.0mm	2mm
Resolving Power	3.7μm	2.1μm	0.92μm	0.69μm	0.50μm	0.40μm
Depth of Focus	48.6μm	416.2μm	3.04μm	1.71μm	0.90μm	0.56μm
Field of View
Eyepiece, 25 Diameter Field	10.0mm	5.0mm	2.5mm	1.25mm	0.50mm	0.25mm
Eyepiece, 20 Diameter Field	4.4mm	2.2mm	2mm	1mm	0.22mm	0.2mm
2/3" Sensor Camera (H x V)	3.52 x 2.64mm	1.76 x 1.32mm	0.88 x 0.66mm	0.44 x 0.33mm	0.18 x 0.13mm	0.011 x 0.08mm
1/2" Sensor Camera (H x V)	2.56 x 1.92mm	1.28 x 0.96mm	0.64 x 0.48mm	0.32 x 0.24mm	0.13 x 0.10mm	0.08 x 0.06mm
Weight	440g	280g	125g	130g	150g	200g
商品名称
2.5X Nikon CF IC Epi Plan TI Interferometry Objective
 
5X Nikon CF IC Epi Plan TI Interferometry Objective 
 
10X Nikon CF IC Epi Plan DI Interferometry Objective 
 
20X Nikon CF IC Epi Plan DI Interferometry Objective
 
50X NIKON CF IC Epi Plan DI Interferometry Objective
 
100X Nikon CF IC Epi Plan DI Interferometry Objective 



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